Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Phys.org

Complex deep learning models are no better at understanding genetic perturbation than simple baseline ones, study finds

Deep learning models have shown great potential in predicting and engineering functional enzymes and proteins. Does this prowess extend to other fields of biology as well? Contrary to expectations, a ...
Mining Weekly

TOMRA Mining launches CONTAIN™: Deep learning classification for inclusion-type ore sorting

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Open Heart

Development and validation of a deep learning model for severe mitral stenosis detection from chest X-rays

Background Although chest X-rays (CXRs) are widely used, diagnosing mitral stenosis (MS) based solely on CXR findings remains ...
Hosted on MSN

Complex deep learning models are no better at understanding genetic perturbation than simple baseline ones, study finds

Deep learning models have shown great potential in predicting and engineering functional enzymes and proteins. Does this prowess extend to other fields of biology as well? Subscribe to our newsletter ...