A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

When a power plant experiences issues with performance, the obvious indicators are usually a loss in load capacity or an increase in fuel consumption. However, other issues exist that can be costly, ...