Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital ICs. Delay testing uses TD (transition delay) patterns created by ATPG (automatic test ...

Please provide your email address to receive an email when new articles are posted on . A synthetic test model was developed to assist in screening injectable cements with a focus on mechanical ...

Leak detection plays a critical role in ensuring packaging reliability, especially in industries where product integrity directly affects safety, sterility or shelf life.

A fast, nondestructive optical method for analyzing defects in two-dimensional materials has been developed, with applications in electronics, sensing, early cancer diagnosis and water desalination.

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

If the technique is confirmed, women who have had miscarriages or those undergoing prenatal screening may no longer need to rely on centralized testing labs for results. By Gina Kolata After 10 years ...